隐身材料 X 波段反射率标准物质的研制
张军英,张雨,林帅,姜维维
中国兵器工业集团第五三研究所,济南 250031
Development of X-band reflectance reference material for stealth materials
张军英,张雨,林帅,姜维维
Institute No.53 of China North Industries Group Corporation, Jinan 250031, China
摘要:
研制了隐身材料 X 波段反射率标准物质。研究了基板厚度对吸波涂层形貌稳定性的影响以及吸波涂 层厚度对反射率的影响。采用雷达散射截面(RCS)法反射率测试系统对隐身材料 X 波段反射率标准物质进行 10 GHz 反射率定值,并对标准物质进行了均匀性、稳定性检验以及不确定度评估。结果表明,选用 6 mm 厚的铝合金作 为基板可以得到形貌稳定的吸波涂层,涂层厚度为 1.2 mm 时隐身材料的 10 GHz 反射率可达 -10 dB,制备的隐身材 料标准物质的 10 GHz 反射率分别为 -9.8、-10.1、-10.3、-9.8、-9.7 dB,扩展不确定度均为 0.9 dB(k=2),6 个月储存 期内稳定性良好,可用于隐身材料 X 波段反射率测试系统的校准。
Abstract:The X-band reflectance reference material of stealth material was developed. The influence of substrate thickness on the morphology stability of absorbing coating and the influence of absorbing coating thickness on reflectivity were studied. The radar cross section(RCS) reflectance measurement system was used to determine the 10 GHz reflectance of X-band reflectance reference materials of stealth materials. The uniformity, stability and uncertainty of reference materials were tested. The results showed that the microwave absorbing coating with stable morphology can be obtained by using 6 mm thick aluminum alloy as the substrate. When the coating thickness was 1.2 mm, the 10 GHz reflectivity of stealth materials could reach -10 dB. The 10 GHZ reflectance of the prepared stealth material reference material was -9.8, -10.1, -10.3, -9.8, -9.7 dB respectively, and the expanded uncertainty was 0.9 dB(k=2). It has good stability during the storage period of 6 months, and can be used for the calibration of X-band reflectance test system of stealth material.
关键词:X 波段;标准物质;反射率;隐身材料
Keywords:X-band; reference substance; reflectance; stealth material
本文引用格式:
张军英,张雨,林帅,等 . 隐身材料 X 波段反射率标准物质的研制[J]. 化学分析计量,2021,30(9):1.
Zhang Junying,Zhang Yu,Lin Shuai,et al. Development of X-band reflectance reference material for stealth materials[J]. Chemical Analysis and Meterage,2021,30(9):1.
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